Affiliations: ICT Research Center, Key Laboratory of Optoelectronic
Technology and System of the Education Ministry of China, Chongqing University,
Chongqing, China | College of Optoelectronic Engineering, Chongqing
University, Chongqing, China | College of Mathematics and Physics, Chongqing
University, Chongqing, China
Abstract: As an advanced nondestructive testing (NDT) technology, industrial
computed tomography (ICT) has been widely applied to diversified areas. In
modern industry, ICT is especially useful for analyzing inner defects of
complex and close work pieces. The common defects of work pieces include gas
cavities, slag inclusions, cracks and shrinking cavities. Only cracks are often
caused by fatigue usage. Precisely extracting a crack is important to estimate
the remaining secure service time of the work piece. This paper presents a
crack surface extraction method of ICT volume data based on finite plane
integral transform (FPIT) and planelet. FPIT and planelet, as new methods of
multiscale geometric analysis (MGA), have distinct discrimination for different
plane singularities. Within the paper, firstly the definitions of FPIT and
planelet are introduced. Secondly, after analyzing the components and
relationship of planelet at monoscale, a fast performance of planelet transform
is designed. Thirdly, the steps of the proposed crack surface extraction method
are described. In numeric experiment, compared with the method of 3D facet
model, C-V model and 3D wavelet respectively, the proposed method can extract
the crack surface full and continuously, which,is robust to noise.
