Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Rao, Donepudi V. | Swapna, Medasani | Cesareo, Roberto | Brunetti, Antonio | Akatsuka, Tako | Yuasa, Tetsuya | Takeda, Tohoru | Gigante, Giovanni E.
Affiliations: Istituto di Matematica e Fisica, Università degli Studi di Sassari, Sassari, Italy | Department of Bio-System Engineering, Faculty of Engineering, Yamagata University, Yonezawa, Japan | Institute of Clinical Medicine, University of Tsukuba, Tsukuba, Japan | Dipartimento di Fisica, Universita di Roma, "La Sapienza" 00185, Roma, Italy
Note: [] Corresponding author: Donepudi V. Rao, Current address: Department of Physics, Sir CRR Autonomous College, Eluru – 534007, Andhra Pradesh, India. E-mail: [email protected]
Abstract: Synchrotron-based scattered radiation form low-contrast phantom materials prepared from polyethylene, polystyrene, nylon, and Plexiglas is used as test objects in X-ray CT was examined with 8, 10 and 12 keV X-rays. These phantom materials of medical interest will contains varying proportions of low atomic number elements. The assessment will allowed us to estimate the fluorescence to total scattered radiation. Detected the fluorescence spectra and the associated scattered radiation from calcium hydroxyapatite phantom with 8, 10 and 12 keV synchrotron X-rays. Samples with Bonefil (60% and 70% of calcium hydroxyapatite) and Bone cream (35 ∼ 45% of calcium hydroxyapatite), were used. Utilized the X-ray micro-spectroscopy beamline facility, X27A, available at NSLS, BNL, USA. The primary beam with a spot size of the order of ∼ 10 μm, has been used for focusing. With this spatial resolution and high flux throuput, the synchrotron-based scattered radiation from the phantom materials were measured using a liquid-nitrogen-cooled 13-element energy-dispersive high-purity germanium detector.
DOI: 10.3233/XST-2010-0255
Journal: Journal of X-Ray Science and Technology, vol. 18, no. 3, pp. 327-337, 2010
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]