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Article type: Research Article
Authors: Frank, Matthias | Friedrich, Stephan | Höhne, Jens | Jochum, Josef
Affiliations: Lawrence Livermore National Laboratory, Livermore CA 94550, USA | Vericold Technologies GmbH, D-80331 Munich, Germany | Technische Universität München, Physik Department, D-85747 Garching, Germany
Note: [] Corresponding author: Matthias Frank, Lawrence Livermore National Laboratory, Physics and Advanced Technologies, M-Division, 7000 East Avenue, Mail Stop L-174, Livermore, CA 94550, USA. Tel.: +1 925 423 5068; Fax: +1 925 424 2778; E-mail: [email protected]
Abstract: Cryogenic detectors are very sensitive, energy-resolving, low-threshold photon and particle detectors, which have been developed over the last decades for a variety of applications in particle physics and astrophysics. More recently, cryogenic detectors have also been applied as high-resolution, photon-counting detectors for energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence analysis (XRFA). Cryogenic detectors can provide an about 10 times better energy resolution for x-rays than achievable with "conventional" energy-dispersive detectors, such as HPGe and Si(Li) detectors. In this review, we give a brief introduction to cryogenic detectors (Section 1) and describe the basic operating principles and achieved performance of two types of cryogenic detectors most applicable to EDS and XRFA, superconducting tunnel junctions (Section 2) and hot-electron microcalorimeters (Section 3). In section 4 we discuss various practical aspects of using these cryogenic detectors for fluorescence applications including their operation at ultra-low temperatures close to XRF specimens at room temperature and achievable solid angle and efficiency. In Section 5 we present results from selected recent EDS and XRF experiments performed with cryogenic detectors and discuss their applications in semiconductor microanalysis and in fluorescence-detected absorption spectroscopy.
Journal: Journal of X-Ray Science and Technology, vol. 11, no. 2, pp. 83-112, 2003
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