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Article type: Research Article
Authors: Giakos, G.C. | Vedantham, S. | Suryanarayanan, S. | Chowdhury, S. | Odogba, J. | Dasgupta, A. | Guntupalli, R. | Sha, N. | Vega-Lozada, V. | Sumrain, S. | Mehta, K. | Patnekar, N.
Affiliations: Olson Research Center, Department of Biomedical Engineering, Laboratory of Imaging Devices, Detectors and Sensors, The University of Akron, Akron, OH 44325, USA}
Note: [] Corresponding author: Dr. George C. Giakos, Olson Research Center, Department of Biomedical Engineering, University of Akron, Akron, OH 44325, USA. Tel.: +330 972 6976; Fax: +330 374 8834; E-mail: [email protected].
Abstract: In this study, the temporal response of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, has been measured. The experimental setup offers potential capabilities for feasibility studies, research, and evaluation of the temporal response and noise characteristics of a Cd1-xZnxTe X-ray sensor system, for fast digital radiographic applications. The dependence of the temporal response of the experimental X-ray detector system on physical and geometrical parameters has been determined experimentally. The results of this study indicate that the overall temporal response of the Cd1-xZnxTe detector system improves with increasing applied electric field, and scanning speed, as well as decreasing detector thickness, and object magnification. Further improvements of the geometrical and signal collection parameters of the detector will improve the speed of the X-ray system significantly.
Journal: Journal of X-Ray Science and Technology, vol. 8, no. 4, pp. 241-251, 1998
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