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Article type: Research Article
Authors: Wu, Hui-Yong | Zhou, Zi-Wei; * | Li, Hong-Kun | Yang, Tong-Tong
Affiliations: Shenyang University of Chemical Technology, Shenyang, China
Correspondence: [*] Corresponding author. Ziwei Zhou, College of Science, Shenyang University of Chemical Technology, Shenyang, 110142, Liaoning, China. Tel.: +86 15524376218; E-mail: [email protected].
Abstract: In order to enhance the accuracy and reliability of fault diagnosis in chemical processes, this paper proposes a methodology for chemical process fault diagnosis based on an improved SE-ResNet-BiGRU neural network. Initially, the ResNet model is enhanced by incorporating the SENet mechanism, enabling the extraction of features from input data and selectively enhancing them, thereby strengthening the model’s ability to capture crucial features. Subsequently, the BiGRU model is employed to perform temporal modeling on the extracted features, allowing for better capture of dynamic changes in fault signals. In order to validate the effectiveness of this approach, experiments are conducted using the TE chemical process dataset. The results are analyzed using methods such as ROC-AUC, confusion matrix, and t-SNE visualization. The improved SE-ResNet-BiGRU model achieves a testing accuracy of 97.78% and an average fault diagnosis rate of 97.24%. Compared to other deep learning methods, this methodology exhibits significant improvements in fault diagnosis rate and reliability. It holds promising potential as an essential tool for fault diagnosis in chemical processes, contributing to enhanced production safety, efficiency, and reduced risk of accidents.
Keywords: Fault diagnosis, residual neural network, bidirectional gate recurrent unit, squeeze-and-excitation network, t-distributed Stochastic neighbor embedding
DOI: 10.3233/JIFS-236948
Journal: Journal of Intelligent & Fuzzy Systems, vol. 46, no. 4, pp. 9311-9328, 2024
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