Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Ameen, Mustafa; * | Alrahmawy, Mohammed | AbouEleneen, Amal | Tolba, Ahmad
Affiliations: Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt
Correspondence: [*] Corresponding author. Mustafa Ameen, Computer Science Department, Faculty of Computers and Information, Mansoura University, Egypt. E-mail: [email protected].
Abstract: Automated visual inspection is becoming an important field of computer vision in many industries. The real-time inspection of flat surface products is a task full of challenges in industrial aspects that requires fast and accurate algorithms for detection and localisation of defects. Structural, statistical and filter-based approaches, such as Gabor Filter Banks, Log-Gabor filter and Wavelets, have high computational complexity. This paper introduces a fast and accurate model for inspection and localization of industrial flat surface products: Neighborhood Preserving Perceptual Fidelity Aware Mean Squared Error (NP-PAMSE). The Extreme Learning Machine (ELM) is used for classification. ELM is found to be the perfect classifier for detecting defects. The proposed model resulted in defect detection accuracy of 99.86%, with 98.16% sensitivity, and 99.90% specificity. These results show that the proposed model outperforms many existing defect detection approaches. The discriminant power displays the efficiency of ELM in differentiation between normal and abnormal surfaces.
Keywords: Automated visual inspection (AVI), perceptual fidelity aware mean squared error (PAMSE), extreme learning machine (ELM)
DOI: 10.3233/JIFS-192071
Journal: Journal of Intelligent & Fuzzy Systems, vol. 39, no. 1, pp. 1183-1196, 2020
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]