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Subtitle:
Article type: Research Article
Authors: Lee, Chang-Hwan
Affiliations: Department of Information and Communications, Dongguk University, Seoul 100-715, Korea. Tel.: +82 2 2260 3801; E-mail: [email protected]
Abstract: We present a new methodology for sequential classification, which employs sequential pattern generation and classification, in a two-stage process. In the first phase, a set of sequential patterns are generated from multi-dimensional sequence data. We proposes a novel method for inducing multi-dimensional sequential patterns with the use of Hellinger measure. The importance of each sequential pattern is also calculated. In the second phase, the generated sequential patterns are used for classifying multi-dimensional sequence data. A number of theorems are proposed to reduce the computational complexity of generating sequential patterns. The proposed method is tested on some synthesized sequence databases.
Keywords: Machine learning, sequential classification, sequential pattern
DOI: 10.3233/IDA-150731
Journal: Intelligent Data Analysis, vol. 19, no. 3, pp. 547-561, 2015
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