Affiliations: Department of Systems Science, National University of Defense Technology, Changsha, China
Correspondence:
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Corresponding author: Chenping Hou, Department of Systems Science, National University of Defense Technology, Changsha, China. E-mail: [email protected].
Abstract: Multiple Instance Learning (MIL) is a widely studied learning paradigm which arises from real applications. Existing MIL methods have achieved prominent performances under the premise of plenty annotation data. Nevertheless, sufficient labeled data is often unattainable due to the high labeling cost. For example, the task in web image identification is to find similar samples among a large size of unlabeled dataset through a small number of provided target pictures. This leads to a particular scenario of Multiple Instance Learning with insufficient Positive and superabundant Unlabeled data (PU-MIL), which is a hot research topic in MIL recently. In this paper, we propose a novel method called Multiple Instance Learning with Bi-level Embedding (MILBLE) to tackle PU-MIL problem. Unlike other PU-MIL method using only simple single-level mapping, the bi-level embedding strategy are designed to customize specific mapping for positive and unlabeled data. It ensures the characteristics of key instance are not erased. Moreover, the weighting measure adopted in positive data can extracts the uncontaminated information of true positive instances without interference from negative ones. Finally, we minimize the classification error loss of mapped examples based on class-prior probability to train the optimal classifier. Experimental results show that our method has better performance than other state-of-the-art methods.
Keywords: Multi-instance learning, positive and unlabeled learning, bi-level embedding, classification
