Affiliations: [a] Center for Manufacturing Systems, and Department of Electrical Engineering, University of Kentucky, Lexington, KY 40506 | [b] Rockwell Science Center, Rockwell International, 1049 Camino Dos Rios, Thousand Oaks, CA 91360
Correspondence:
[**]
Author to whom all correspondence should be addressed.
Note: [*] This work is supported in part by NASA grant NGT-40049, Rockwell International, NSF grant ECS-9308737, and the Center for Robotics and Manufacturing Systems at the University of Kentucky.
Abstract: The discrete-event nature of on-line data from an automated manufacturing system offers many challenges for on-line fault detection. In this paper, the template monitoring method is developed as a simple but versatile method of using discrete event signals for fault monitoring of manufacturing systems. This monitoring method is easily distributable, suitable for monitoring highly concurrent systems, and has low computational requirements. This paper describes template monitoring using event observations, and demonstrates a method for automatically generating template monitoring models from timed automata specifications.
