Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Subtitle: The Ontology Summit 2015
Article type: Other
Authors: Underwood, Marka | Gruninger, Michaelb | Obrst, Leoc; * | Baclawski, Kend | Bennett, Mikee | Berg-Cross, Garyf | Hahmann, Torsteng | Sriram, Ramh
Affiliations: [a] Krypton Brothers, Port Washington, NY, USA | [b] University of Toronto, Toronto, Canada | [c] The MITRE Corporation, McLean, VA, USA | [d] Northeastern University, Boston, MA, USA | [e] Hypercube Ltd, London, UK | [f] Knowledge Strategies, Washington, DC, USA | [g] University of Maine, Orono, ME, USA | [h] National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
Correspondence: [*] Corresponding author: Leo Obrst, The MITRE Corporation, McLean, VA, USA. Tel.: +1 703 983 6770; E-mail: [email protected].
Note: [] Accepted by: Nicola Guarino
DOI: 10.3233/AO-150153
Journal: Applied Ontology, vol. 10, no. 3-4, pp. 355-365, 2015
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]