Dual spectral limited-angle CT imaging regularized by edge-preserving diffusion and smoothing

Article type: Research Article

Authors: Qin, Yanwei^{a; b; 1} | Zhang, Yinghui^{a; b; 1} | Lu, Xin^{a; b} | Zhao, Yunsong^{a; b; c; *} | Zhao, Xing^{a; b; c}

Affiliations: [a] School of Mathematical Sciences, Capital Normal University, Beijing, China | [b] Beijing Advanced Innovation Center for Imaging Technology, Capital Normal University, Beijing, China | [c] Shenzhen National Applied Mathematics Center, Southern University of Science and Technology, Shenzhen, China

Correspondence: [*] Corresponding author: Yunsong Zhao, School of Mathematical Sciences, Capital Normal University, Beijing, 100048, China. E-mail: [email protected].

Note: [1] These authors contributed equally to this work and should be considered co-first authors.

Abstract: Limited-angle CT scan is an effective way for nondestructive inspection of planar objects, and various methods have been proposed accordingly. When the scanned object contains high-absorption material, such as metal, existing methods may fail due to the beam hardening of X-rays. In order to overcome this problem, we adopt a dual spectral limited-angle CT scan and propose a corresponding image reconstruction algorithm, which takes the polychromatic property of the X-ray into consideration, makes basis material images free of beam hardening artifacts and metal artifacts, and then helps depress the limited-angle artifacts. Experimental results on both simulated PCB data and real data demonstrate the effectiveness of the proposed algorithm.

Keywords: Planar objects, dual spectral limited-angle CT imaging, the high-absorption material

DOI: 10.3233/XST-221302

Journal: Journal of X-Ray Science and Technology, vol. 31, no. 3, pp. 573-592, 2023