Authors: Bitter, M. | Hill, K.W. | Jones, F. | Scott, S.
This paper defines the exact conditions for the application of a previously proposed, general, non-astigmatic, imaging scheme, consisting of a matched pair of spherically bent crystals or reflectors, to x rays. These conditions lead to two specific experimental arrangements, of which one can provide large magnifications. Potential applications include the x-ray diagnosis of laser-produced plasmas and x-ray imaging of, e.g., biological samples, using the highly monochromatic radiation at synchrotron light sources. The
…results obtained for x rays are, however, valid for a wide spectrum of the electromagnetic radiation so that, for instance, an application of one of the imaging schemes to lithography in the EUV wavelength range should also be possible, if the spherically bent crystals are replaced by appropriate spherical reflectors. Also described is the design of an x-ray crystal spectrometer, which meets the here defined, necessary requirements for the observation of the x-ray spectra of helium-like argon.
Keywords: Non-astigmatic imaging, large angles of incidence and uniform magnification, imaging of biological samples, EUV lithography, x-ray diagnosis of laser-produced plasmas, monochromatic radiation from synchrotron light sources
Citation: Journal of X-Ray Science and Technology,
vol. 17, no. 2, pp. 153-160, 2009
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