Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Jaslam, P.K. Muhammeda; * | Kumar, Manoja | Bhardwaj, Nitina | Salinder, b | Sumit, Vikash Kumarc
Affiliations: [a] Department of Mathematics and Statistics, CCS Haryana Agricultural University, Haryana, India | [b] Department of Agriculture & Farmers Welfare, Haryana Government, Panchkula (Haryana), India | [c] Department of Statistics, University of Lucknow, Lucknow, India
Correspondence: [*] Corresponding author: Muhammed Jaslam Poolakkal, Intermountain Forestry Cooperative, Forest, Rangeland, and Fire Sciences, College of Natural Resources, University of Idaho, 875 Perimeter Dr MS 1133, Moscow 83844-1133, Idaho. E-mail: [email protected].
Abstract: Crop statistics for a small area, such as the community development block, are an increasingly important topic in agricultural statistics. Under normality assumptions, the classic Empirical Best Linear Unbiased Prediction (EBLUP) technique is effective for predicting small area means, however the Small Area Estimation (SAE) model can be heavily affected by the incidence of outliers or deviations from the expected distribution. The purpose of this study was to estimate variance, predict block-level wheat crop yield in the Hisar and Sirsa district of Haryana by classical SAE method and a robust random-effect predictor using a slight generalization of Huber’s Proposal 2. In the case of Sirsa district, the results of classical and robust unit level SAE were very close, but not in the case of Hisar district. This could be due to the influential observation found in the Hisar data set. More accurate EBLUP wheat yield estimates are obtained when the Huber-type M-estimation method is initialized by the least square regression estimator.
Keywords: EBLUP, Huber-type M-estimation, Maximum likelihood, Mean squared prediction error, NDVI, Small area estimation
DOI: 10.3233/MAS-221416
Journal: Model Assisted Statistics and Applications, vol. 18, no. 2, pp. 171-181, 2023
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]