The synthesis, characterization and phase stability of tin sulfides (SnS₂, SnS and Sn₂S₃) films deposited by ultrasonic spray

Article type: Research Article

Authors: Kherchachi, Imen Bouhaf^* | Attaf, Abdallah | Saidi, Hanane | Bouhdjar, Adel | Bendjdidi, Hamza | Youcef, Benkhetta | Azizi, Rahil

Affiliations: Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria

Correspondence: [*] Corresponding author: Imen Bouhaf Kherchachi, Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, BP 145 RP, 07000 Biskra, Algeria. Tel.: +213795118708; E-mail: [email protected].

Abstract: In this study, we will deal with the influences of deposition time on structural, optical and electrical properties of SnxSy films which have grown through ultrasonic spray technique. The SnxSy thin films are deposited on glass substrate at 300°C with a deposition time of t = 2 min-10 min, using two precursors: tin (II) chloride and tin (IV) chloride, respectively. The obtained films were characterized by X-ray diffraction (XRD), The UV–VIS–NIR optical transmittance measurements and the electrical resistivity by four -points. The X-ray diffraction (XRD) analysis of SnxSy films indicates three phases of SnS2, SnS and Sn2S3 phases crystallites. In addition, this analysis revealed that SnS2 phase stability is superior than SnS and Sn2S3 stability. The results of (UV) spectroscopy visible spectrum demonstrate that films deposited at 10 min are low transmittance in the visible region for two precursors, and a direct band gap found to decrease with increase in deposition time. Electrical measurements indicate that the resistivity behavior depends on the used precursors and deposition time.

Keywords: Sn_xS_y thin films, stability, tin sulfide, ultrasonic spray, deposition time, precursors

DOI: 10.3233/MGC-160202

Journal: Main Group Chemistry, vol. 15, no. 3, pp. 231-242, 2016