Coherent Radiation for X-Ray Imaging—The Soft X-Ray Undulator and the X1A Beamline at the NSLS

Article type: Research Article

Authors: Rarback, H. | Buckley, C. | Ade, H. | Camilo, F. | DiGennaro, R. | Hellman, S. | Howells, M. | Iskander, N. | Jacobsen, C. | Kirz, J. | Krinsky, S. | Lindaas, S. | McNulty, I. | Oversluizen, M. | Rothman, S.^; | Sayre, D. | Sharnoff, M. | Shu, D.^;

Affiliations: NSLS, Brookhaven National Laboratory, Upton, New York 11973 | Physics Department, SUNY, Stony Brook, New York 11794 | Lawrence Berkeley Laboratory, Berkeley, California 94720 | University of California, San Francisco, California 94143 | IBM Research Center, Yorktown Heights, New York 10598 | Physics Department, University of Delaware, Newark, Delaware 19711 | IHEP, Academia Sinica, Beijing, People's Republic of China

Note: [] Present address: Physics Department, Kings College, The Strand, London WC2R 2LS, UK.

Note: [] Present address: Physics Department, Princeton University, Princeton, NJ 08544.

Note: [] Present address: Geochemistry, Lamont-Doherty Geological Observatory, Palisades, NY 10964.

Note: [] Present address: Lawrence Berkeley Laboratory, Berkeley, CA 94720.

Note: [] Present address: SERC, Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK.

Abstract: An undulator-based beamline was built and commissioned at the National Synchrotron Light Source to provide tunable coherent radiation in the 200–800 eV range. The low emittance of the storage ring means that the undulator source has high brightness so that a large flux of coherent x rays is delivered to experimental stations. The beamline uses a horizontally dispersing bichromator that allows two experiments to run simultaneously, making use of the first and second harmonics of the undulator output. In addition, the use of horizontally deflecting optics enables the beamline alignment to be insensitive to electron beam motion since the horizontal electron beam size is quite large. The beamline and its performance are discussed with emphasis on the optics and on stability, radiation, and vacuum considerations.

DOI: 10.3233/XST-1990-2404

Journal: Journal of X-Ray Science and Technology, vol. 2, no. 4, pp. 274-296, 1990