Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Lifton, J.J.*
Affiliations: University of Southampton Malaysia Campus, Iskandar Puteri, Johor, Malaysia
Correspondence: [*] Corresponding author: J.J. Lifton, University of Southampton Malaysia Campus, 79200 Iskandar Puteri, Johor, Malaysia. Tel.: +60 607 560 2465; Fax: +60 607 560 2561; E-mail: [email protected].
Abstract: Beam hardening causes cupping and streaking artifacts in computed tomographic images, the presence of such artifacts can impair both qualitative and quantitative analysis of the reconstructed data. When the scanned object is composed of a single material, it is possible to correct beam hardening artifacts using the linearization method. However, for multi-material objects, an iterative segmentation-based correction algorithm is needed, which is not only computationally expensive, but may also fail if the initial segmentation result is poor. In this study, a new multi-material linearization beam hardening correction method was proposed and evaluated. The new method is fast and implemented in the same manner as a mono-material linearization. The correction takes approximately 0.02 seconds per projection. Although facing a potential disadvantage of requiring attenuation measurements of one of the object’s constituent materials, applying the new method has demonstrated its capability for a multi-material workpiece with substantial reduction in both cupping and streaking artifacts. For example, the study showed that the absolute cupping artefacts in steel, titanium and aluminum spheres were reduced from 22%, 20% and 20% to 5%, 1% and 0%, respectively.
Keywords: Beam hardening, computed tomography, multi-material, linearization
DOI: 10.3233/XST-16197
Journal: Journal of X-Ray Science and Technology, vol. 25, no. 4, pp. 629-640, 2017
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]