Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Zeng, Li; | Zou, Xiaobing;
Affiliations: ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China, Chongqing University, Chongqing, China | College of Mathematics and Physics, Chongqing University, Chongqing, China | Department of Computer Science, College of Chongqing Education, Chongqing, China
Note: [] Corresponding author. E-mail: [email protected]
Abstract: This paper is about inspecting large and long object using dual helical cone-beam computed tomography (CT) and Katsevich-type reconstruction algorithm. Conventional cone-beam helical industrial CT imaging is based on the assumption that the entire cross-section of an object is illuminated with x-rays at each view angle. The field of view is limited by the width of planar detector. As an alternative, this paper developed a dual-helical scanning. When scanning at each helix, part of cross-section is covered by x-ray at each view angle. During reconstruction, Katsevich-type algorithm is applied, which does not rebin projection data. The algorithm is approximate, as it applies Hilbert transform on truncated projection. The reconstruction result is better than extended FDK algorithm, especially for large helical pitch.
Keywords: Industrial CT, cone beam, dual helical scanning, Katsevich-type algorithm
DOI: 10.3233/XST-2010-0266
Journal: Journal of X-Ray Science and Technology, vol. 18, no. 4, pp. 353-367, 2010
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]