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Article type: Research Article
Authors: Durak, R. | Gülen, Y. | Kurudirek, M. | Kaçal, M. | Çapoğlu, İ.
Affiliations: Department of Physics, Science Faculty, Atatürk University, Erzurum, Turkey | Department of Internal Medicine, Medicine Faculty, Atatürk University, Erzurum, Turkey
Abstract: The present study investigated the trace element contents in the blood sera of type II diabetic patients with and without complication as compared to non-diabetic healthy controls. The elements Na, Mg, Al, Si, P, S, Cl, K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, Se, Mo, Cd, Hg and Pb were determined by wavelength dispersive x-ray fluorescence spectrometry. Blood serum levels of some trace elements in patients with type II diabetes mellitus showed significant deviations from healthy controls. Mean Ca, Cu and Se (p< 0.05) concentrations (%) in both diabetic patients with and without complication were significantly lower than those in healthy controls. When compared with non-diabetic control group, the Mg concentrations of patients without complication were decreasing while Mg levels of patients with at least one complication were increasing (p< 0.05). Si levels were significantly higher both in diabetic patients with complication and without complication than healthy controls (p< 0.05). K and Hg levels of diabetic patients with at least one complication have significantly deviated from both healthy controls and patients without complication (p< 0.05). There were no significant differences between control group and diabetic patients concerning height, age, weight and body mass index (p> 0.05).
Keywords: Diabetes mellitus, trace elements, blood serum, wavelength dispersive x-ray fluorescence spectrometry
DOI: 10.3233/XST-2010-0247
Journal: Journal of X-Ray Science and Technology, vol. 18, no. 2, pp. 111-120, 2010
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