Features of XEOL spectra evaluation depending on optical density of the sample

Article type: Research Article

Authors: Kochubey, V.I. | Konyukhova, Ju. G.

Affiliations: Saratov State University, 410012 Saratov, Russia | Institute of Mechanics and Physics of Saratov State University, 410026 Saratov, Russia

Note: [] Corresponding author: Vyacheslav I. Kochubey, Chair of Optics, Physics Department, Saratov State University, Astrakhanskaya st. 83, 410012 Saratov, Russia. Tel.: +7 8452 51 51 95; Fax: +7 8452 27 85 29; E-mail: [email protected]

Abstract: Effect of competition in excitation between luminescence centres and the rest of a sample on intensity of luminescence in the visual range under exciting with synchrotron radiation is considered. It is shown that the competition gives rise to distortion of XEOL spectra. In this case the obtained structure data are incorrect. An algorithm of data correction is proposed. It is demonstrated that, to apply this algorithm, it is necessary to use three-detector circuit of recording XEOL spectra. The examples of correction of XEOL spectra of KBr and NaCl-Ni samples are given.

Keywords: XEOL, EXAFS, spectrum correction

Journal: Journal of X-Ray Science and Technology, vol. 13, no. 2, pp. 81-84, 2005