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Article type: Research Article
Authors: Wanner, Alexander | Dunand, David C.
Affiliations: Institut für Metallkunde, Universität Stuttgart, Stuttgart, Germany | Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
Note: [] Corresponding author.
Abstract: The availability of high-energy X-rays from 3rd-generation synchrotron sources offers new approaches to study internal stresses in the bulk of crystalline materials. A method with a wide application potential is the transmission technique introduced by Daymond and Withers, which however has so far been limited to fine-grained materials. In the present work, the reasons for the currently existing limitations are discussed and a viable strategy to extend the technique to samples with coarser grain sizes is proposed.
Keywords: Internal stress measurement, X-ray diffraction, Monochromatic high-energy X-rays, Probe volume, Grain size
DOI: 10.1080/10238160108200182
Journal: Journal of Neutron Research, vol. 9, no. 2-4, pp. 495-501, 2001
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