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Article type: Research Article
Authors: Zheng, Zhangqia; b | Liu, Yongshana; * | Zhang, Binga; b | Ren, Jiadonga; b | Zong, Yongshenga | Wang, Qiana; b | Yang, Xiaoleia | Liu, Qiana
Affiliations: [a] School of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei, P.R. China | [b] The Key Laboratory of Software Engineering of Hebei Province, Qinhuangdao, China
Correspondence: [*] Corresponding author. Yongshan Liu, School of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei P.R, 066004, China. E-mail: [email protected].
Abstract: A software defect is a common cyberspace security problem, leading to information theft, system crashes, and other network hazards. Software security is a fundamental challenge for cyberspace security defense. However, when researching software defects, the defective code in the software is small compared with the overall code, leading to data imbalance problems in predicting software vulnerabilities. This study proposes a heterogeneous integration algorithm based on imbalance rate threshold drift for the data imbalance problem and for predicting software defects. First, the Decision Tree-based integration algorithm was designed following sample perturbation. Moreover, the Support Vector Machine (SVM)-based integration algorithm was designed based on attribute perturbation. Following the heterogeneous integration algorithm, the primary classifier was trained by sample diversity and model structure diversity. Second, we combined the integration algorithms of two base classifiers to form a heterogeneous integration model. The imbalance rate was designed to achieve threshold transfer and obtain software defect prediction results. Finally, the NASA-MDP and Juliet datasets were used to verify the heterogeneous integration algorithm’s validity, correctness, and generalization based on the Decision Tree and SVM.
Keywords: Software defect, imbalance rate, heterogeneous, integration, threshold shift
DOI: 10.3233/JIFS-224457
Journal: Journal of Intelligent & Fuzzy Systems, vol. 45, no. 3, pp. 4807-4824, 2023
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