Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Han, Hongxiaa; b | Li, Qingguoa; *
Affiliations: [a] College of Mathematics and Econometrics, Hunan University, Changsha, P.R. China | [b] Department of Applied Mathematics, Yuncheng University, Yuncheng, P.R. China
Correspondence: [*] Corresponding author. Qingguo Li, College of Mathematics and Econometrics, Hunan University, Changsha 410082, P.R. China. E-mail: [email protected].
Abstract: Consider L = (L, ∗ , 1) be a complete residuated lattice. For an arbitrary function φ defined from the set of all singletons to that of all L-sets, Chen and Li introduced a type of L-fuzzy rough sets in 2007, called φ-fuzzy rough sets in this paper. The well-known R-fuzzy rough sets, where R is an L-fuzzy relation, can be regarded as a special φ-fuzzy rough sets. In this paper, we prove that φ-fuzzy rough sets can be represented by a family of R-fuzzy rough sets. Then we define some special φ of being serial, reflexive, symmetric, transitive and Euclidean, and discuss the corresponding φ-fuzzy rough sets, respectively. At last, we study the induced L-topology by φ when it is reflexive or reflexive and transitive.
Keywords: Complete residuated lattice, φ-fuzzy rough set, L-topology
DOI: 10.3233/IFS-162206
Journal: Journal of Intelligent & Fuzzy Systems, vol. 31, no. 3, pp. 1397-1406, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]