Complementarity of Various Diffraction Techniques Applied to Characterisation of Residual Stress in a Palladium Alloy

Article type: Research Article

Authors: Carradó, A. | Sprauel, J.-M. | Barrallier, Laurent | Lodini, A.

Affiliations: E.N.S.A.M., Laboratoire LM3 ESA CNRS 8006, 151 Bd de l’hôpital, F-75013 Paris, France | LM3 UPRESA-CNRS 8006, IUT, 2 av. Gaston Berger, F-13625 Aix en Provence, France | E.N.S.A.M., Équipe MécaSurf, 2, Cours des Arts et Métiers, 13617 Aix en Provence, France | L.A.C.M.-Laboratoire d’Analyse de Contraintes Mécaniques, Université de Reims, France

Note: [] Corresponding author. E-mail: [email protected]

Abstract: The residual stress (RS) profile state of a palladium alloy sample, used in dentistry applications, has been determined by various diffraction techniques. An additional aim of this work was to improve different experimental methods dedicated to such RS evaluation, demonstrating that the X-ray, neutron and high-energy synchrotron X-ray diffraction (HESXRD) techniques are complementary when employed in different zones of the sample.

Keywords: Residual stress, Neutron, Synchrotron, XRD, Palladium alloy, Simulation

DOI: 10.1080/10238160410001734513

Journal: Journal of Neutron Research, vol. 12, no. 1-3, pp. 93-98, 2004