Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Hosseinzadeh, Mehdi | Reshadi, Midia | Khademzadeh, Ahmad | Navi, Keivan
Affiliations: Science and Research Branch, Islamic Azad University, Tehran, Iran | Iran Telecommunication Research Center, Tehran, Iran | Department of Electrical and Computer Engineering, Shahid Beheshti University, Tehran, Iran
Abstract: Residue Number System (RNS) is an integer and non weighted number system that is useful tool for Digital Signal Processing (DSP) since it can support parallel, carry-free, high-speed and low power arithmetic. Redundant Residue Number System is an extension of RNS which also supports error detection and correction. The Multi-Level Residue Number System uses the new Residue Number System for each modulo, so in the relation of decreasing modulo the speed of operation is increased. By the combination of those systems we purpose a new numeric system which supports parallel and high speed computations, restricted carry propagation and reliable communications. This system also supports high error detection and correction capabilities. Because of design challenge of future nanoscale regime, on-chip networks have been proposed as a solution. As technology scales toward deep submicron, on-chip interconnects are becoming more sensitive to noise sources such as crosstalk or power supply noise. Therefore error detection and correction is one of the major properties of future on-chip micro networks. In this paper we propose using Redundant Multi-Level Residue Number System to increase the data transmission reliability in on-chip networks. This method achieves more optimizations in the terms of data security, error detection and correction, high speed data transmission and computation.
Keywords: networks on chip, intra-extra chip level communication, residue number system, error detection and correction, fault tolerant system
Journal: Journal of Integrated Design & Process Science, vol. 12, no. 1, pp. 13-22, 2008
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]