Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Anderle, Markusa | Hundley, Douglas R.b | Kirby, Michael J.b
Affiliations: [a] Department of Mathematics, Colorado State University, Fort Collins, CO 80523, USA | [b] Department of Mathematics, Whitman College, Walla Walla, WA 99362, USA
Abstract: We present a graphical method for evaluating the quality of a feature extraction mapping. Based on the Bilipschitz criterion, this Bilipschitz Criterion Plot (BCP) can be used to evaluate dimension reducing mappings for relative quality and to estimate the injectivity of the reduction map (as well as the associated reconstruction map). It can also be used to survey regions where the map is locally an expansion or contraction map. The plot is easy and fast to construct, and gives much more insight than any single value can, such as the distance preservation error. We demonstrate the value of such a mapping when examining the quality of the Sammon map, Neuroscale, the autoassociative map, and a recent technique that is designed to optimize the BCP in a linear fashion, the adaptive secant basis algorithm.
Keywords: bilipschitz criterion plot (BCP), dimensionality reduction, distance preserving mappings, sequential adaptive secant basis
DOI: 10.3233/IDA-2002-6106
Journal: Intelligent Data Analysis, vol. 6, no. 1, pp. 85-104, 2002
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]